Nikon T Plan SLWD 20x Objective LCPLN50XIR Quality control and manufacturing inspection

Quality control and manufacturing inspection

Brightness is controlled remotely via an existing control on the microscope as standard

Compatible with Nikon's advanced upright microscope systems

This is particularly important at low magnifications where the field of view is large—flat-field correction eliminates the need to refocus when examining features at different positions in the field

90 (top lens in) / NA 0

Nikon T Plan SLWD 20x Objective LCPLN50XIR Quality control and manufacturing inspectionThe Nikon CFI60 2 T Plan Fluor EPI SLWD 20x Objective is an exceptional Super Long Working Distance (SLWD) objective engineered for reflected light (EPI) applications where extended clearance between the lens and specimen is critical. With a 30mm working distance and N. A. 0. 3, it delivers sharp, high contrast imaging even when working with large, bulky, or encased samples. 20x magnification with N. A. 0. 3 for balanced resolution and field of view