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NIKON CFWE 15X EYEPIECES FOR THE ALPHAPHOT MICROSCOPES LEICA enabling silicon wafer through-inspection

SKU 59975018293
4.0
Description

enabling silicon wafer through-inspection

other infinity-corrected M26 systems Country of Origin Japan SKU 378-805-3 University and institutional purchase orders are welcome

low-magnification overview imaging with the Nikon 1

5X C-MOUNT FOR LEICA INSERT DIAMETER: 37MM

The Plan Fluor optical design delivers bright

NIKON CFWE 15X EYEPIECES FOR THE ALPHAPHOT MICROSCOPES LEICA enabling silicon wafer through-inspectionNIKON CFWE 15X EYEPIECES FOR THE ALPHAPHOT MICROSCOPES. EYEPIECES ARE IN EXCELLENT AS NEW CONDITION.

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