US$ 16.00
Infrared imaging applications
Rapid specimen orientation and coarse defect location in multi-magnification inspection workflows
The "Super Fluor" designation indicates enhanced optical performance compared to standard fluorite objectives
real-time observation
hunched shoulders
Nikon L Plan 20X SLWD EPI Objective NIKON STAGES NIKON Infrared imaging applicationsNIKON L PLAN 20X SLWD EPI OBJECTIVE M32 THREAD WORKING DISTANCE: 24 MM CATALOG NUMBER MUE30200 CONDITION: LIGHT USE FLAWLESS OPTICS UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS
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